XRF spectrometers are robust elemental composition analysis instruments that are used the world over in industry and research as critical due diligence, positive materials identification, valuation, and regulatory compliance tools. An XRF spectrometer provides simultaneous analysis of a wide range of elements, and can be used as either a qualitative screening tool or a fully quantitative elemental analysis instrument.
In general, analysis with XRF spectrometry is nondestructive, not altering the sample in any way. The only technical exception to this nondestructive property is that some samples need to be prepared for analysis. Whether or not samples need to be prepared (grain size reduced, homogenized, etc.) depends on the analyst’s data quality objectives, as well as the sample’s initial chemical and physical makeup.
The CAIS X-ray Fluorescence (XRF) Laboratory operates multiple portable and laboratory based XRF systems. Our commitment to high quality XRF data extends to the development of user specific analytical calibrations for solids, powders, liquids, ash, obsidian, historic copper alloys and ceramics for example, and training in the proper use, calibration and data reporting for pXRF.
