WDXRF Spectrometer

The CAIS maintains a Phillips (Panalytical) PW2420 wavelength-dispersive XRF spectrometer purchased new in 2002. The instrument has a total power of 2.4 kW and a 170 position robotic multisampler. A variety of flow and scintillation detectors, collimators, and beam filters, coupled with an array of crystals (LIF200; LIF220; GE111; PE002; and PX1) allow accurate analysis of a wide range of materials. A sample spinner reduces effects of sample surface inhomogeneity. The unit can be run in quantitative (Super Q) or standardless (IQ+) mode, and includes the new generation of Protraceª software capable of sub-ppm detection limits. We can also analyze water samples at ppb levels via the new UltraCarryª filter substrate from Rigaku.

The CAIS has commissioned a new ARL QUANT'X EDXRF Spectrometer. This instrument provide major, minor and trace element quantification across the broadest range of samples, including bulk solids, granules, powders, thin films, filters, and all manner of liquids with extreme ease of sample prep. The ARL QUANT'X offers a combination of advanced technology and special features for a wide range of EDXRF applications, including non-destructive analysis of thin films in the tens of angstroms range.

Samples can be analyzed for major element analysis by the borate fusion method, and for trace element analysis using pressed pellets or 100% non-destructively depending on your application.

The CAIS maintains a Bruker Tracer III SD portable XRF spectrometer that is applicable to wide range of sample matrices. A fully portable and vacuum and/or He-purge capable instrument, this XRF has superior sensitivity and precision and is routinely used for obsidian source studies, analyses of archaeological metals (copper, bronze, gold, silver, etc.), and detection of heavy metal pesticides in museum collections. The instrument is equipped with a rhodium tube and a SDD detector with a resolution of ca. 145 eV FHWM for 5.9 keV X-rays (at 100,000 cps). Unique laboratory generated matrix specific calibrations are available for many sample matrices.

     XRF Facility :: Analytical Costs :: Sample Submission

For further information contact Dr. Doug Dvoracek (706) 542-6136 or
Jeff Speakman (706) 542-6115