The X-Ray fluorescence (XRF) facility at the CAIS focuses primarily on elemental analyses
of environmental, geological, and archaeological materials (obsidian, ceramics, and metals).
In addition to this capability for conventional matrix-matched standards-based analyses, we
also can employ powerful fundamental parameters algorithms to facilitate analyses of unusual
or oddly shaped samples such as artifacts, semiconductor materials, air quality (particulate)
samples, or virtually any solid material of sufficient size.
With multiple XRF instruments available, we can identify the best approach for your specific application. WD EDXRF Portable XRF